Cart (Loading....) | Create Account
Close category search window
 

Simultaneous design of reliable H filter and fault detector for linear continuous-time systems with sensor outage faults

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Guang-hong Yang ; Coll. of Inf. Sci. & Eng., Northeastern Univ., Shenyang ; Heng Wang

The paper studies the problem of simultaneous design of reliable filter and fault detector for a class of linear continuous-time systems with bounded disturbances and nonzero constant reference inputs. An Hinfin filter and two detection weighting matrices are designed simultaneously. The filter is designed for both fault free and faulty cases, and by manipulating the steady-state values of the filter states and the measured outputs with the detection weighting matrices, a residual is then generated, through which the sensor outage faults can be detected effectively. A convergent iterative algorithm based on linear matrix inequality (LMI) is given to obtain the solutions. A numerical example is given to illustrate the effectiveness of the proposed methods.

Published in:

American Control Conference, 2008

Date of Conference:

11-13 June 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.