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A small-delay defect detection technique for dependable LSIs

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4 Author(s)
Noguchi, K. ; Device Platforms Res. Labs., NEC Corp., Sagamihara ; Nose, K. ; Ono, T. ; Mizuno, M.

As continuous process scaling produces large-scale chips, small-delay defects become one of the major chip-reliability limiters. Small-delay defect detection techniques for LSI screening have been developed, which can successfully detect outlier chips among normally-distributed chips in a short testing time. In our experiments with 90 nm CMOS 100 MHz test chips, we have successfully detected around 1-ns path-delay shift caused by small-delay defects in only 1/25 of testing time.

Published in:

VLSI Circuits, 2008 IEEE Symposium on

Date of Conference:

18-20 June 2008