By Topic

Limit on the Addressability of Fault-Tolerant Nanowire Decoders

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Yeow Meng Chee ; Nanyang Technological University, Singapore ; Alan C. H. Ling

Although prone to fabrication error, the nanowire crossbar is a promising candidate compoent for next generation nanometer-scale circuits. In the nanowire crossbar architecture, nanowires are addressed by controlling voltages on the mesowires. For area efficiency, we are interested in the maximum number of nanowires N(m,e) that can be addressed by m mesowires, in the face of up to e fabrication errors. Asymptotically tight bounds on N(m,e) are established in this paper. In particular, it is shown that N(m,e) = Theta(2m / mepsiv+1/2). Interesting observations are made on the equivalence between this problem and the problem of constructing optimal EC/AUED codes, superimposed distance codes, pooling designs, and diffbounded set systems. Results in this paper also improve upon those in the EC/AUEC codes literature.

Published in:

IEEE Transactions on Computers  (Volume:58 ,  Issue: 1 )