Cart (Loading....) | Create Account
Close category search window
 

An adaptive enhanced focusing technique for whole slide imaging using contextual information

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Wei Xiong ; Inst. for Infocomm Res., A-STAR, Singapore ; Qi Tian ; Joohwee Lim

Optical imaging systems especially microscopy systems under higher magnifications often have relatively limited depth of field. This constraint results in partial focusing in the image. To overcome this partial focusing problem, enhanced focusing (EF) techniques are introduced to generate all-well-focused images. A sequence of images for each field is acquired at the same image field and along the same optical axis at different acquisition depths. The images are partitioned into tiles where the best focused sub-images for each tile among the sequence is found. The final image is the mosaicking of the found sub-images. Whole slide imaging (WSI) is an emerging imaging technology since the mid-1990s. It automatically acquires digital images from a biomedical slide field by field using robotic microscopic devices at high resolution and then stitches them together to form a large-dimensional high- resolution montage. Each field is just a small window of the large scene of the slide. In the context of WSI, all fields are to be focused and such an EF-WSI procedure could be very slow. In this work, we have proposed a new adaptive focusing method using contextual information in the slide for EF-WSI. We can reduce about 1/3 of computation time while maintaining good image quality.

Published in:

Industrial Electronics and Applications, 2008. ICIEA 2008. 3rd IEEE Conference on

Date of Conference:

3-5 June 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.