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In this paper the scattering characteristics are calculated with the technique based on the volume integral equations for polarization currents. Full-wave analysis is performed. A silicon-on-sapphire periodic structure is used to study the guided-mode resonances in plane-wave excitation conditions. Numerical computations for the reflection spectral resonances are presented for both weak and strong layer modulations. Spectral stability of resonances as a function of angle of incidence is investigated.