Close category search window
 

A new short-bar method for 4TP admittance standards calibration by using modified Z-matrix expression to improve S/N for higher impedance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Suzuki, K. ; Meas. Stand. Center, Agilent Technol. Int. Japan, Ltd., Hachioji, Japan

This paper describes how to calibrate four-terminal-pair (4TP) admittance standards using a new short-bar method with modified Z-matrix expression containing a correction term. The short-bar method is to measure the signal to correspond to the standard with better S/N for higher impedance standard, especially 1 pF. Therefore a 1 pF capacitor can be calibrated containing the direct measurement at reporting frequencies. As this method does not require the equivalent circuit, it can be applied to general 4TP admittance calibration.

Published in:
Precision Electromagnetic Measurements Digest, 2008. CPEM 2008. Conference on

Date of Conference: 8-13 June 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.