Cart (Loading....) | Create Account
Close category search window
 

A Schedulability Analysis of Deferrable Scheduling Using Patterns

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Song Han ; Univ. of Texas, Austin, TX ; Deji Chen ; Ming Xiong ; Mok, A.K.

The schedulability testing for the deferrable scheduling algorithm for fixed priority transactions (DS-FP) remainsan open problem since its introduction. In this paper, wetake the first step towards investigating necessary and sufficient conditions for the DS-FP schedulability. We propose a necessary and sufficient schedulability condition for the algorithm in discrete time systems, and prove its correctness. Based on this condition, we propose a schedulability test algorithm that is more accurate than the existing test that is only based on a sufficient condition. Our algorithm exploits the fact that there is always a repeating pattern in a DS-FP schedule in discrete time systems. We demonstrate through examples that our schedulability test algorithm outperforms the existing algorithm in terms of accuracy.

Published in:

Real-Time Systems, 2008. ECRTS '08. Euromicro Conference on

Date of Conference:

2-4 July 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.