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EBIC and HR-TEM study of catastrophic optical damaged high power multi-mode InGaAs-AlGaAs strained quantum well lasers

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4 Author(s)
Sin, Y. ; Electron. & Photonics Lab., Aerosp. Corp., El Segundo, CA ; Presser, N. ; Foran, B. ; Moss, S.C.

We report our investigation of catastrophic optical damaged high power multi-mode InGaAs-AlGaAs strained quantum well (QW) lasers using electron beam induced current (EBIC), focused ion beam (FIB), and high-resolution transmission electron microscope (HR-TEM) techniques.

Published in:
Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on

Date of Conference: 4-9 May 2008

Page(s):
1 - 2
Print ISBN:
978-1-55752-859-9
INSPEC Accession Number:
10132603
Conference Location :
San Jose, CA
Product Type:
Conference Publications

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