By Topic

800 nm WDM Interrogation System for Strain, Temperature, and Refractive Index Sensing Based on Tilted Fiber Bragg Grating

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Rui Suo ; Photonics Res. Group, Aston Univ., Birmingham ; Xianfeng Chen ; Kaiming Zhou ; Lin Zhang
more authors

A low-cost high-resolution wavelength-division-multiplexing (WDM) interrogation system operating around 800 nm region with operational bandwidth up to 60 nm and resolution of 12.7 pm utilizing a tilted fiber Bragg grating (TFBG) and a CCD-array detector has been implemented. The system has been evaluated for interrogating fiber Bragg grating based strain, temperature sensors, giving sensitivities of 0.59 pm/muepsiv and 5.6 pm/degC, which are in good agreement with previously reported values. Furthermore, the system has been utilized to detect the refractive index change of sample liquids, demonstrating a capability of measuring index change as small as 10-5. In addition, the vectorial expression of phase match condition and fabrication of TFBG have been discussed.

Published in:

Sensors Journal, IEEE  (Volume:8 ,  Issue: 7 )