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A Systematical Method of Quantifying SEU FIT

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3 Author(s)
Shi-Jie Wen ; Cisco Syst., Inc., San Jose, CA ; Alexandrescu, D. ; Perez, R.

We present a practical, systematical method for the evaluation of the soft error rate (SER) of microelectronic devices. Existing methodologies, practices and tools are integrated in a common approach while highlighting the need for specific data or tools. The showcased method is particularly adapted for evaluating the SER of very complex microelectronic devices by engineers confronted to increasingly demanding reliability requirements.

Published in:

On-Line Testing Symposium, 2008. IOLTS '08. 14th IEEE International

Date of Conference:

7-9 July 2008

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