Cart (Loading....) | Create Account
Close category search window

Current Topics Related to STM and AFM

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Morita, S. ; Hiroshima University.

Current topics related to scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) are reviewed. The first two topics concern recent applications of STMs and AFMs as microscopes with atomic resolution, and recent experiments on atomic and molecular manipulation using STMs. A new multifunctional scanning probe microscope (SPM) system incorporating an AFM/STM is then introduced. Finally, current topics at the last STM international conference (STM'91) are discussed.

Published in:

Magnetics in Japan, IEEE Translation Journal on  (Volume:8 ,  Issue: 3 )

Date of Publication:

March 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.