IEEE.org| IEEE Xplore Digital Library| IEEE Standards| IEEE Spectrum| More Sites

Cart (Loading....) | Create Account | 

Close category search window
Author Searchbeta |  Advanced Search  |  Preferences |  Search Tips  |  More Search Options  
 
Browse Conference Publications > Electrical and Computer Engin ... Help

Beampattern random behavior in wireless sensor networks with Gaussian distributed sensor nodes

Full Text Sign-In or Purchase

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing! close button
puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ahmed, M.F.A. ; Dept. of Electr. & Comput. Eng., Alberta Univ., Edmonton, AB ; Vorobyov, S.A.

Collaborative beamforming (CB) has been introduced in wireless sensor networks (WSNs) to increase the transmission range of sensor nodes. CB improves the power efficiency of the transmission. However, the CB beampattern is random in the sidelobe region. Therefore, it is important to characterize the power level in the sidelobe region to predict the interference to neighboring sensor node clusters. In this paper, we assume that sensor nodes in a cluster of WSN are Gaussian distributed and study the random behavior of the beampattern. To characterize the beampattern in the sidelobe region, we first model the array factor as a complex random variable and find the corresponding mean and variance. The distribution function of beampattern level and the outage probability of sidelobes is derived and compared with the corresponding characteristics resulting from uniform distributed sensor nodes.

Published in:
Electrical and Computer Engineering, 2008. CCECE 2008. Canadian Conference on

Date of Conference: 4-7 May 2008

Page(s):
000257 - 000260
ISSN :
0840-7789
E-ISBN :
978-1-4244-1643-1
Print ISBN:
978-1-4244-1642-4
INSPEC Accession Number:
10103636
Conference Location :
Niagara Falls, ON
Digital Object Identifier :
10.1109/CCECE.2008.4564535

IEEE Account

Purchase Details

Profile Information

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.