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Development of MFM-SEM System for Observation of Magnetic Domains

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7 Author(s)

The magnetic force microscope (MFM) has the potential of enabling observations of fine magnetic domain structures, but remaining problems must be resolved before practical application is possible. As a result of theoretical analysis, the most suitable values of the probe-sample distance h and probe radius R were found to be h = 600 Å and R = 100 Å. Using these values, an MFM cantilever of length 130 ¿m, width 10 ¿m and thickness 1 ¿m was designed. A scanning tunneling microscope (STM) was used to detect the cantilever displacement resulting from the magnetic force. A new domain configuration was observed by scanning electron microscopy (SEM) by bringing a sharp Fe wire tip close to a sample and observing the influence of the leakage field of the tip.

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Magnetics in Japan, IEEE Translation Journal on  (Volume:5 ,  Issue: 12 )