Cart (Loading....) | Create Account
Close category search window
 

Variational registration of tensor-valued images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Barbieri, S. ; Math. Image Anal. Group, Saarland Univ., Saarbrucken ; Welk, M. ; Weickert, J.

We present a variational framework for the registration of tensor-valued images. It is based on an energy functional with four terms: a data term based on a diffusion tensor constancy constraint, a compatibility term encoding the physical model linking domain deformations and tensor reorientation, and smoothness terms for deformation and tensor reorientation. Although the tensor deformation model employed here is designed with regard to diffusion tensor MRI data, the separation of data and compatibility term allows to adapt the model easily to different tensor deformation models. We minimise the energy functional with respect to both transformation fields by a multiscale gradient descent. Experiments demonstrate the viability and potential of this approach in the registration of tensor-valued images.

Published in:

Computer Vision and Pattern Recognition Workshops, 2008. CVPRW '08. IEEE Computer Society Conference on

Date of Conference:

23-28 June 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.