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Scalable statistical measurement and estimation of a mmWave CML static divider sensitivity in 65nm SOI CMOS

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3 Author(s)
Kim, D.D. ; IBM Semicond. R&D Center, Hopewell Junction, NY ; Choongyeun Cho ; Jonghae Kim

A CML static divider operates up to 82.4 GHz with 90% yield for 0 dBm input is statistically measured and estimated. The proposed method of statistical measurement enables reliable sensitivity curve estimation by 55% of standard variation, based on the analytic model, simulations, and scalable DC and RF measurements for the first time. A 300 mm full wafer is scanned for the validation.

Published in:

Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE

Date of Conference:

June 17 2008-April 17 2008

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