By Topic

Scalable statistical measurement and estimation of a mmWave CML static divider sensitivity in 65nm SOI CMOS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Kim, D.D. ; IBM Semicond. R&D Center, Hopewell Junction, NY ; Choongyeun Cho ; Jonghae Kim

A CML static divider operates up to 82.4 GHz with 90% yield for 0 dBm input is statistically measured and estimated. The proposed method of statistical measurement enables reliable sensitivity curve estimation by 55% of standard variation, based on the analytic model, simulations, and scalable DC and RF measurements for the first time. A 300 mm full wafer is scanned for the validation.

Published in:

Radio Frequency Integrated Circuits Symposium, 2008. RFIC 2008. IEEE

Date of Conference:

June 17 2008-April 17 2008