By Topic

Simultaneous measurement of soft error rate of 90 nm CMOS SRAM and cosmic ray neutron spectra at the summit of Mauna Kea

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Tosaka, Y. ; Fujitsu Labs. Ltd., Tokyo ; Takasu, R. ; Uemura, T. ; Ehara, H.
more authors

We carried out simultaneous measurement of SERs and cosmic ray neutron spectra for the first time. We measured SERs using 90 nm CMOS SRAM chips and measured neutron spectra using a Bonner multisphere spectrometer. We carried out the SER field measurement at the 4200 m summit of Mauna Kea, which is the most suitable place for SER field measurements because the neutron flux is over 10 times greater there than that at sea level. Therefore, we could avoid making field measurements that usually require a long measuring time (about a year) to obtain sufficient accuracy.

Published in:

Reliability Physics Symposium, 2008. IRPS 2008. IEEE International

Date of Conference:

April 27 2008-May 1 2008