Cart (Loading....) | Create Account
Close category search window

Spectrum etiquettes for terrestrial and high-altitude platform-based cognitive radio systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Likitthanasate, P. ; Commun. Res. Group, York Univ., York ; Grace, D. ; Mitchell, P.D.

Two spectrum etiquettes are developed for the use on the downlink of coexisting high-altitude platform (HAP) and terrestrial fixed broadband systems that are intended for future application with cognitive radio-based user terminals with directional antennas. The spectrum etiquettes are based on the interference to noise ratio and carrier to interference plus noise ratio levels at the receiver of an incumbent user. Antenna beamwidths and multiple modulation scheme levels determine the parameter settings for coexistence performance. It is shown that coexistence performance can be improved by exploiting the surplus transmitter power of the terrestrial system, thereby enabling the incumbent terrestrial system to accommodate additional interference arising from a newly activated HAP system.

Published in:

Communications, IET  (Volume:2 ,  Issue: 6 )

Date of Publication:

July 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.