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Accurate modeling of memory effects of RF amplifiers has becomes of prime importance in the design process for the new generations of communications systems. A tremendous amount of modeling techniques has been proposed lately. A capital point in this behavioral modeling is the ease and accuracy of model parameter extraction process along with the model run time efficiency in system level simulation tools. This paper proposes an new and effective extraction technique for dynamic Volterra series based model, as well as an improvement of the so- called compound volterra structure and its implementation technique in system level simulation.