Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Near-Field Electromagnetic Characterization and Perturbation of Logic Circuits

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
7 Author(s)
Dubois, T. ; Inst. d''Electron. du Sud, Univ. Montpellier II, Montpellier ; Jarrix, S. ; Penarier, Annick ; Nouvel, P.
more authors

We propose here a nondestructive electromagnetic (EM) near-field test bench for both EM compatibility and susceptibility of circuits. This setup permits both the collection of the near field and injection without contact of a disturbing EM field, all through a probe. Exhaustive characterizations of probes are undertaken via simulations and experiments. According to their design, they are supposedly linked more to the electric or the magnetic field. Simulations of their EM behavior are undergone to fix their optimal geometries, leading to the best measurement performances. It is shown by both the simulations and the S-parameter measurements that their presence does not interfere with the electric behavior of the device under test. Then, logic circuits are characterized from the EM point of view, with the help of this test bench. Circuits are placed on three different printed boards: one double-sided low-frequency board without a ground plane and two single-sided boards with a ground plane and a design that is more or less optimized. EM near-field mappings highlight the strong field areas of the circuits. The need for a ground plane is highlighted. Field patterns on the traces are linked with those observed on microstrip lines. Then, an EM aggression is injected over a supposed sensitive zone of the circuit. Whichever printed board is considered, a parasitic signal superimposes itself on the output signal of the gates. Deepened studies are undergone to exhaustively explain the phenomena observed.

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:57 ,  Issue: 11 )