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High Frequency Permeability Measurement of Magnetic Thin Films

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7 Author(s)
M. Hayakawa ; Sony Corp. Research Center. ; K. Hayashi ; Y. Ochiai ; H. Matsuda
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A device for automated measurement of the permeability of thin films is described. Specimens are placed in a high frequency band magnetic field, and the induced emf measured using a differential detection coil, with a damping resistance inserted to prevent resonance. The frequency is varied to find the ¿-f characteristic. The device was used to measure the characteristic of a sputtered Sendust film 4 mm by 4 ¿m up to 100 MHz; measurements required only a few minutes' time.

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IEEE Translation Journal on Magnetics in Japan  (Volume:1 ,  Issue: 4 )