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LAN-based LXI Instrument Systems- the Next Step in the Evolution of Measurement System Technology

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6 Author(s)
Burch, J. ; Meas. Res. Lab., Agilent Technol., Inc, Santa Clara, CA ; Cataldo, A. ; Eidson, J. ; Fernandez, A.
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In the field of measurement, many of the leading test and measurement, T&M, companies have formed the LXI Consortium with the explicit goal of specifying an Ethernet-based architecture for T&M instrument systems. This paper explores the LXI architecture and gives performance figures illustrating the benefits of using this architecture.

Published in:
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE

Date of Conference: 12-15 May 2008

Page(s):
399 - 404
ISSN :
1091-5281
E-ISBN :
978-1-4244-1541-0
Print ISBN:
978-1-4244-1540-3
INSPEC Accession Number:
10059235
Conference Location :
Victoria, BC
Digital Object Identifier :
10.1109/IMTC.2008.4547068
Product Type:
Conference Publications

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