By Topic

Depletion region geometry analysis applied to single event sensitivity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Langworthy, J.B. ; US Naval Res. Lab., Washington, DC, USA

The effects of device geometry on single-event-upset (SEU) rate in space, beginning with the ground test measurements, are explored. Analysis of sensitive volume geometry is used to establish a relationship between it and SEU cross section. This relationship is used as a basis for geometric models wherein measured cross sections determine model shape parameters. Fits of one of these models to a range of experimental cross sections are exhibited. These fits and physical argument suggest that the actual sensitive volume shape differs from that assumed in most current calculations, i.e. a rounded shape with no lower corners is more appropriate than the box shape currently used. A correction that justifies a current heuristic practice of relating critical charge to an LET (linear energy transfer) on the shoulder of the cross section rather than to onset LET is devised. A further correction is obtained by a calculation using the omnidirectional chord distribution for a hemisphere. Together the two corrections show that nearly an order of magnitude error results from assuming that the sensitive volume is box shaped when calculating upset rate due to isotropic fluences

Published in:

Nuclear Science, IEEE Transactions on  (Volume:36 ,  Issue: 6 )