Cart (Loading....) | Create Account
Close category search window

Characteristics of GaAs DCFL MESFET's and inverters exposed to high-energy neutrons

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Bloss, W.L. ; Aerosp. Corp., Los Angeles, CA, USA ; Yamada, W.E. ; Rosenbluth, M.L. ; Janousek, B.K.

A systematic investigation of the effects of high-energy neutrons on GaAs metal-semiconductor field-effect transistors (MESFETs) and direct-coupled FET logic (DCFL) gates has been carried out. Measurements were made of the threshold voltage shifts and the transconductance and saturation current degradation of GaAs enhancement- and depletion-mode MESFETs, which comprise the DCFL logic gates, at neutron fluences ranging from 5×1013-2×1015 n/cm2 (E>keV). DCFL inverter characteristics were measured and successfully simulated with SPICE using device parameters extracted from the neutron-damaged FETs. Ring oscillator measurements were made to determine the effects of high-energy neutrons on the frequency performance of DCFL circuits. Measurements confirm that propagation delays scale inversely with the device transconductance. The results of this investigation are useful in predicting how GaAs ICs, fabricated using DCFL logic, will perform in a high-energy-neutron environment

Published in:

Nuclear Science, IEEE Transactions on  (Volume:36 ,  Issue: 6 )

Date of Publication:

Dec 1989

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.