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State-Sensitive X-Filling Scheme for Scan Capture Power Reduction

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2 Author(s)
Jing-Ling Yang ; Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong ; Qiang Xu

Based on the operation of a state machine, this paper elucidates a comprehensive frame for probability-based primary-input-dominated X-filling methods to minimize the total weighted switching activity (WSA) during the scan capture operation. Experimental results demonstrate that the proposed approach significantly reduces both average and peak WSAs.

Published in:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:27 ,  Issue: 7 )