Cart (Loading....) | Create Account
Close category search window
 

Enhanced power analysis attack using chosen message against RSA hardware implementations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Miyamoto, A. ; Grad. Sch. of Inf. Sci., Tohoku Univ., Sendai ; Homma, N. ; Aoki, T. ; Satoh, A.

SPA (simple power analysis) attacks against RSA cryptosystems are enhanced by using chosen-message scenarios. One of the most powerful chosen-message SPA attacks was proposed by Yen et. al. in 2005, which can be applied to various algorithms and architectures, and can defeat the most popular SPA countermeasure using dummy multiplication. Special input values of -1 and a pair of -X and X can be used to identify squaring operations performed depending on key bit stream. However, no experimental result on actual implementation was reported. In this paper, we implemented some RSA processors on an FPGA platform and demonstrated that Yen's attack with a signal filtering technique clearly reveal the secret key information in the actual power waveforms.

Published in:

Circuits and Systems, 2008. ISCAS 2008. IEEE International Symposium on

Date of Conference:

18-21 May 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.