Cart (Loading....) | Create Account
Close category search window

A New Measurement of Systematic Similarity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yi Guan ; Harbin Inst. of Technol., Harbin ; Xiaolong Wang ; Qiang Wang

The relationship of similarity may be the most universal relationship that exists between every two objects in either the material world or the mental world. Although similarity modeling has been the focus of cognitive science for decades, many theoretical and realistic issues are still under controversy. In this paper, a new theoretical framework that conforms to the nature of similarity and incorporates the current similarity models into a universal model is presented. The new model, i.e., the systematic similarity model, which is inspired by the contrast model of similarity and structure mapping theory in cognitive psychology, is the universal similarity measurement that has many potential applications in text, image, or video retrieval. The text relevance ranking experiments undertaken in this research tentatively show the validity of the new model.

Published in:

Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on  (Volume:38 ,  Issue: 4 )

Date of Publication:

July 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.