Referenced Items are not available for this document.
A novel method to determine the noise parameters of receivers or devices under test (DUTs) for on-wafer microwave noise measurements is presented. An iterative technique is utilized, and fast convergence is achieved by the proposed impedance selection principle. This proposed method reduces the parameter variations in the conventional methods. The impact of the impedance difference on noise parameter determination is experimentally evaluated using a DUT fabricated in a standard 90-nm CMOS technology.
Published in:
Instrumentation and Measurement, IEEE Transactions on
(Volume:57
,
Issue:
11
)
Date of Publication: Nov. 2008
- Page(s):
- 2462 - 2471
- ISSN :
- 0018-9456
- INSPEC Accession Number:
- 10251419
- Digital Object Identifier :
- 10.1109/TIM.2008.925021
- Product Type:
- Journals & Magazines
- Date of Publication :
- 30 May 2008
- Date of Current Version :
- 10 October 2008
- Issue Date :
- Nov. 2008
- Sponsored by :
- IEEE Instrumentation and Measurement Society
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