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Case Study on Speed Failure Causes in a Microprocessor

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4 Author(s)

In this article, we identify the underlying speed paths and perform a detailed analysis on the effects of multiple input switching, cross-coupling noise, and localized voltage drop on microprocessor. We employ cycle-wise clock shrinks on a tester combined with a CAD methodology to unintrusively identify and analyze these speed paths. Understanding the causes of speed failures can help designers make better power and performance tradeoffs.

Published in:

IEEE Design & Test of Computers  (Volume:25 ,  Issue: 3 )