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Determination of overwrite specification in thin-film head/disk systems

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3 Author(s)
M. K. Bhattacharyya ; Hewlett-Packard Co., Palo Alto, CA, USA ; H. S. Gill ; R. F. Simmons

A self-consistent write analysis using the Preisach model is presented and used to calculate overwrite in thin-film head/disk systems. Two overwrite characterization procedures are discussed, and for each of the procedures the calculated values are compared with measurements. Through a correlation of overwrite, nonlinear peak shifts, and readback output voltage the authors determine the overwrite requirement. They show that whereas -30 dB of overwrite will ensure a satisfactory overall performance of the recording system, a much lower overwrite, say -20 dB, can work in certain situations. An analytical implementation of the self-consistent model is presented and verified with measurements. The analytical approach can be used to determine the overwrite at any applied field for any head/disk combination. The authors introduce a normalized effective field hn, which depends on Mrδ, Hc, and other head/disk parameters. It is shown that a value of h n greater than 0.8 is needed for overwrite values of better than 25 dB. The importance of various head/disk parameters in optimizing the overwrite is also discussed

Published in:

IEEE Transactions on Magnetics  (Volume:25 ,  Issue: 6 )