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Machine Learning Approach for Ontology Mapping Using Multiple Concept Similarity Measures

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1 Author(s)
Ichise, R. ; Principles of Inf. Res. Div., Nat. Inst. of Inf., Tokyo

This paper presents a new framework for the ontology mapping problem. We organized the ontology mapping problem into a standard machine learning framework, which uses multiple concept similarity measures. We presented several concept similarity measures for the machine learning framework and conducted experiments for testing the framework using real-world data. Our experimental results show that our approach has increased performance with respect to precision, recall and F-measure in comparison with other methods.

Published in:

Computer and Information Science, 2008. ICIS 08. Seventh IEEE/ACIS International Conference on

Date of Conference:

14-16 May 2008