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A new approach to analysis and simulation of single and coupled low-loss interconnects.

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3 Author(s)
Ligocka, A. ; Dept. of Multimedia Telecommun. & Microelectron., Poznan Univ. of Technol., Poznan ; Bandurski, W. ; Rydlichowski, P.

In the paper the new method of computing the threshold crossing times for the low-loss interconnect is presented. The interconnect output response is calculated using the multiple scales method with the perturbation parameter related to the line losses. From the derived formula, the analytical form for threshold crossing time is obtained. The algorithm that uses the step response calculations for two symmetric, coupled interconnects is also presented.

Published in:

Circuit Theory and Design, 2007. ECCTD 2007. 18th European Conference on

Date of Conference:

27-30 Aug. 2007