Cart (Loading....) | Create Account
Close category search window
 

An Efficient Graph-Based Algorithm for ESD Current Path Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)

The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high current densities in a small device and burn it out, so on-chip protection circuits for IC pads are required. To reduce the design cost, the protection circuit should be added only for the IC pads with an ESD current path, which causes the ESD current path analysis problem. In this paper, we first introduce the analysis problem for ESD protection in circuit design. We then model the circuit as a constraint graph, decompose the ESD connected components (ECCs) linked with the pads, and apply breadth-first search (BFS) to identify the ECCs in each constraint graph and, thus, the current paths. Experimental results show that our algorithm can very efficiently and economically detect all ESD paths. For example, our algorithm can detect all ESD paths in a circuit with more than 1.3 million vertices in 1.39 s and consume only 44-MB memory on a 3.0-GHz Intel Pentium 4 PC. To the best of our knowledge, our algorithm is the first point tool available to the public for the ESD analysis.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:27 ,  Issue: 8 )

Date of Publication:

Aug. 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.