Cart (Loading....) | Create Account
Close category search window
 

A Coupling Scheme of Analytical Method and FEM for Analysis of Magnetic Field by Singular Line Currents

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Young Sun Kim ; Sch. of Inf. & Commun. Eng., Sungkyunkwan Univ., Suwon ; Hong Soon Choi ; Il Han Park ; Ki Sik Lee

This paper proposes a coupling method involving the finite element (FE) equation of a discretized region and an analytical equation along with the field singularity of line currents in two-dimensional space. The singular field in the interior region is represented by Green's function of the line source, and the exterior region of air, conductor, or ferromagnetic material is represented by using the finite element method (FEM). An analytical expression for a magnetic field that contains unknown coefficients is coupled with the FE formulation for a coupled system equation with a matrix form. A numerical experiment relating to a line current near a ferromagnetic material shows the validity of this coupling method.

Published in:

Magnetics, IEEE Transactions on  (Volume:44 ,  Issue: 6 )

Date of Publication:

June 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.