Notification:
We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kyung Ki Kim ; SUN Microsyst., Santa Clara, CA ; Jing Huang ; Yong-Bin Kim ; Lombardi, Fabrizio

This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The primary goal is the generation of a signal containing a known amount of each jitter component. This signal can then be used for testing high speed serial data channels. Initially, jitter components are analyzed and modeled individually. Next, sequences for combining them are modeled, simulated and evaluated. Model simulation using Matlab is utilized to show the unique features of the components when they are combined into different injection sequences for producing the total jitter. Sequence dependency is investigated in depth and the validity of superposition of jitter components for typical values is confirmed. A good agreement between theory and simulation is verified; these results allow test engineers to have an insight into the interactions among jitter components in serial data channels.

Published in:

Industrial Informatics, IEEE Transactions on  (Volume:4 ,  Issue: 2 )