Cart (Loading....) | Create Account
Close category search window

A New Soft Sensor Based on Dynamic Principal Component Analysis and on-line Potential Fuzzy Clustering

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Amanian, K. ; Pet. Univ. of Technol., Tehran ; Salahshoor, K. ; Jafari, M.R. ; Mosallaie, M.

In this paper, a new soft sensor methodology is proposed for estimation of product concentration in a chemical process. The new soft sensor utilizes dynamic principle component analysis (DPCA) method to select the optimum reduced process variables as the appropriate inputs. DPCA eliminates the high correlations among the process variable measurements, leading to a lower dimensional uncorrelated principle components of the process measurements. The DPCA transformed measurements are then used to train a global nonlinear fuzzy model, based on an on-line potential fuzzy clustering approach, for unmeasurable variable estimation. The developed soft sensor performance is demonstrated on a simulated distillation column benchmark problem.

Published in:

Networking, Sensing and Control, 2008. ICNSC 2008. IEEE International Conference on

Date of Conference:

6-8 April 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.