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Synthetic test circuits for the operational tests of TCR and TSC Thyristor valves

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3 Author(s)
Baoliang Sheng ; ABB AB, HVDC, 77180 Ludvika, Sweden ; Marcio Oliveira ; Hans-Ola Bjarme

Synthetic test circuits are developed for the operational test of Thyristor Controlled Reactor (TCR) valve and Thyristor Switched Capacitor (TSC) valve. The synthetic test current circuits are independent controllable in current stress and voltage stress applied on the test object. By careful design of circuit parameters those test circuits can produce test stresses on TCR valve or TSC valve equal to or greater than those that are foreseen to appear in service. Tests on several TCR and TSC valves have proved that those new synthetic test circuits are a technical sound and economy saving solution in valve design verification.

Published in:

2008 IEEE/PES Transmission and Distribution Conference and Exposition

Date of Conference:

21-24 April 2008