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Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz

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5 Author(s)
Chahine, I. ; Res. Inst. for Embedded Syst. (IRSEEM), Ecole Super. d''Ing. (ESIGELEC), Rouen ; Kadi, M. ; Gaboriaud, E. ; Louis, A.
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This paper deals with the characterization, as well as the modeling, of the susceptibility of integrated circuits (ICs) to conducted electromagnetic disturbances such as a continuous-wave disturbance. Based on accurate measurement results, a robust mathematical model to predict the susceptibility of a CMOS inverter is developed. This model is based on a neural network approach and is validated up to 1 GHz for different test criteria. A good agreement between measurements and simulated results is reported. The mathematical model is implemented in a software tool such as Advanced Design System in order to facilitate its operation in the evaluation of the susceptibility of ICs.

Published in:

Electromagnetic Compatibility, IEEE Transactions on  (Volume:50 ,  Issue: 2 )

Date of Publication:

May 2008

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