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This paper deals with the characterization, as well as the modeling, of the susceptibility of integrated circuits (ICs) to conducted electromagnetic disturbances such as a continuous-wave disturbance. Based on accurate measurement results, a robust mathematical model to predict the susceptibility of a CMOS inverter is developed. This model is based on a neural network approach and is validated up to 1 GHz for different test criteria. A good agreement between measurements and simulated results is reported. The mathematical model is implemented in a software tool such as Advanced Design System in order to facilitate its operation in the evaluation of the susceptibility of ICs.