Skip to Main Content
We propose and demonstrate a 1-symbol delayed dual-channel linear optical sampling for observing optical differential phase-shift keying (DPSK) signals. As this technique is based on optical gate processing by means of interference with local short pulses, its performance allows ultrafast measurement for a symbol rate of greater than 100 Gsymbol/s. Moreover, as the new measurement apparatus employs a two-series interferometer system with a 1-symbol delay, the measured phase distribution reflects the signal quality between adjacent symbols of the optical DPSK signals. In our experiment, we successfully observe the waveform degradation caused by the coherence of the light source and the pattern effect of the phase modulator. The measurement system noise is also discussed.