Cart (Loading....) | Create Account
Close category search window
 

Developing custom signal processing algorithm with labview FPGA and compact RIO to detect the Aortic Stenosis disease

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Al-Naami, B. ; Hashemite Univ., Zarqa ; Chebil, J. ; Trabsheh, B. ; Mgdob, H.

FPGAs provide an ideal template for run-time reconfigurable (RTR) designs. Only recently have RTR enabling design tools that bypass the traditional synthesis and bit stream generation process for FPGAs become available. Heart auscultation which is the interpretation of sounds produced by the heart is a fundamental tool in the diagnosis of heart disease. It is the most commonly used technique for screening and diagnosis in primary health care. This study aims at utilizing the discrete wavelet packet transforms in early detection of an Aortic Stenosis (AS) using heart sound data collected at Sussex University Hospital in England. From the data analysis, a criteria has been proposed for the detection of the AS disease from the heart sound data.

Published in:

Computers in Cardiology, 2006

Date of Conference:

17-20 Sept. 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.