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Browse Conference Publications > VLSI Test Symposium, 2008. VT ... Help

An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories

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3 Author(s)
Harutunyan, G. ; Virage Logic, Yerevan ; Vardanian, V.A. ; Zorian, Y.

Previously, a minimal algorithm of length 70 N, N is the number of memory bits, was proposed for a subclass of dynamic faults. In this paper, a March-based fault location and full diagnosis algorithm of complexity 88 N+29 is proposed for the same subclass of dynamic faults in bit-oriented SRAMs.

Published in:
VLSI Test Symposium, 2008. VTS 2008. 26th IEEE

Date of Conference: April 27 2008-May 1 2008

Page(s):
95 - 100
ISSN :
1093-0167
Print ISBN:
978-0-7695-3123-6
INSPEC Accession Number:
9964427
Conference Location :
San Diego, CA
Digital Object Identifier :
10.1109/VTS.2008.33
Product Type:
Conference Publications

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