By Topic

Test circuit for measuring pulse widths of single-event transients causing soft errors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Narasimham, B. ; Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN ; Gadlage, M.J. ; Bhuva, B.L. ; Schrimpf, R.D.
more authors

A novel on-chip test circuit to measure single event transient (SET) pulse widths has been developed and implemented in IBM 130-nm and 90-nm processes for characterizing logic soft errors. Test measurements with energetic ions show transient widths ranging from 100 ps to over 1 ns, comparable to legitimate logic signals in such technologies. Design options to limit the SET pulse width and hence to mitigate soft errors were evaluated with the test circuit to demonstrate the effectiveness of such design techniques.

Published in:

Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on

Date of Conference:

24-27 March 2008