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The Effects of Electrostatic Discharge on Microelectronic Devices A Review

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2 Author(s)
William D. Greason ; Faculty of Engineering Science, The University of Westein Ontario ; G. S. Peter Castle

Electrostatic discharge (ESD) can cause permanent and temporary failures in microelectronic devices. Protection networks are used on electrostatic discharge sensitive devices in order to raise their immunity to damage from ESD. A review is given of the causes and nature of ESD, including the case of discharge from the human body. A description of failure mechanisms is presented along with a summary of protection networks and techniques.

Published in:

IEEE Transactions on Industry Applications  (Volume:IA-20 ,  Issue: 2 )