Close category search window
 

A Particle Filtering Blind Equalization Algorithm for Frequency-Selective Mimo Channels with Unknown Noise Variance

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Bordin, C.J. ; Inst. Tecnol. de Aeronaut., Sao Jose dos Campos ; Bruno, M.G.S.

This paper introduces a new fully Bayesian, particle-filter-based blind equalization algorithm for frequency-selective MIMO channels. By treating the noise variances observed by each receiver as unknown independent random variables, the proposed algorithm offers increased robustness in comparison to previous particle-filter-based methods that relied on the exact knowledge or on suboptimal estimates of those quantities. We also innovate by considering the use of convolutional codes for user separation in MIMO channels. Via numerical simulations, we verify that the proposed approach performs closely to the optimal (MAP) receiver based on the BCJR algorithm, outperforming a linear trained method for medium to low noise levels.

Published in:
Computational Advances in Multi-Sensor Adaptive Processing, 2007. CAMPSAP 2007. 2nd IEEE International Workshop on

Date of Conference: 12-14 Dec. 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.