Cart (Loading....) | Create Account
Close category search window

Degradation Study of Organic Semiconductor Devices Under Electrical and Optical Stresses

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Jassi, M. ; Magma Design Autom. India Pvt. Ltd., Bangalore ; Gurunath, R. ; Iyer, S.S.K.

Degradation due to electrical and optical stresses on organic semiconductor devices fabricated with imidazolin-5-one as an active layer is studied in this letter. It is found that while both electrical and optical stresses degrade device performance, the former leads to much faster degradation as compared with the latter. It is found that in electrical-stress degradation, the drop in current is a strong function of the charge flowing through the device during stress (charge fluence). For optical-stress degradation, it is strongly dependent on the duration of stress. It is also found that the input electrical and light energy during the stress may be annealing out some of the defects in the device and, hence, mitigating the degradation due to the applied stress.

Published in:

Electron Device Letters, IEEE  (Volume:29 ,  Issue: 5 )

Date of Publication:

May 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.