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Technology Performance Comparison of Triacs Subjected to Fast Transient Voltages

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2 Author(s)
L. Gonthier ; STMicroelectronics, IMS / ASD & IPAD, Rue Pierre et Marie Curie - BP 7155, France ; A. Passal

This paper presents an experimental comparison of several Triac devices under immunity tests, as described in the IEC 61000-4-4 standard. After a short reminder of the different Triac technologies available today (TOP, MESA and PLANAR technologies), the IEC 61000-4-4 test procedure to compare the devices is explained. The immunity results are discussed according to the devices' technology and the gate current sensibilities. A discussion about relevance of dV/dt parameter and die area is carried on to differentiate the devices in term of immunity capability.

Published in:

2007 7th International Conference on Power Electronics and Drive Systems

Date of Conference:

27-30 Nov. 2007