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This paper presents an experimental comparison of several Triac devices under immunity tests, as described in the IEC 61000-4-4 standard. After a short reminder of the different Triac technologies available today (TOP, MESA and PLANAR technologies), the IEC 61000-4-4 test procedure to compare the devices is explained. The immunity results are discussed according to the devices' technology and the gate current sensibilities. A discussion about relevance of dV/dt parameter and die area is carried on to differentiate the devices in term of immunity capability.