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PWM-based test stimuli generation for BIST of high resolution ΣΔ ADCs

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2 Author(s)
Daniela De Venuto ; Politecnico di Bari, Italy. ; Leonardo Reyneri

A fully digital test stimuli generation and on-chip specifications evaluation for cheap, fast, though accurate testing of high resolution ΣΔ ADCs are here presented. Simulations and measurements showed a discrimination threshold on specification parameters up to -90 dBc. The proposed method helps reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.

Published in:

2008 Design, Automation and Test in Europe

Date of Conference:

10-14 March 2008