PWM-based test stimuli generation for BIST of high resolution ΣΔ ADCs

A fully digital test stimuli generation and on-chip specifications evaluation for cheap, fast, though accurate testing of high resolution ΣΔ ADCs are here presented. Simulations and measurements showed a discrimination threshold on specification parameters up to -90 dBc. The proposed method helps reduce the cost of ADC production test, to extend test coverage and to enable built-in self-test and test-based self-calibration.