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The commonality of vector generation techniques

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1 Author(s)
Davidson, S. ; Sun Microsystems

The value of test compression is that it has allowed us to move along a continuum between the extremes of ATPG and logic BIST, and has enabled us to find the right combination of test size, test coverage, and test time for a given situation. The basic similarity among different DFT techniques should make us feel confident that we are on the right track in our drive for efficient test compression.

Published in:

Design & Test of Computers, IEEE  (Volume:25 ,  Issue: 2 )