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Wireless System for Microwave Test Signal Generation

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3 Author(s)
Qizhang Yin ; Monolithic Power Syst., San Jose ; Eisenstadt, W.R. ; Tian Xia

RF testing involves distribution of an RF source to chips. This article describes an RF embedded-testing technique that distributes RF sources to the unpackaged RF chip via an antenna. The authors demonstrate this technique on a 5-GHz low-noise amplifier, thus eliminating expensive RF probes and test fixtures.

Published in:

Design & Test of Computers, IEEE  (Volume:25 ,  Issue: 2 )

Date of Publication:

March-April 2008

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