Cart (Loading....) | Create Account
Close category search window
 

Performance Optimization of Temporal Reasoning for Grid Workflows Using Relaxed Region Analysis

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Ke Xu ; Tsinghua Univ., Beijing ; Cao, Junwei ; Lianchen Liu ; Cheng Wu

With quick evolution of grid technologies and increasing complexity of e-science applications, reasoning temporal properties of grid workflows to ensure reliability and trustworthiness is becoming a critical issue. Relaxed region analysis (RRA) is proposed in this work for performance optimization of grid workflow verification by decomposing workflows into separate standard regions with parallel branches. The approach is implemented in GridPiAnalyzer, a pi calculus based formal verifier for grid workflows, and validated using gravitational wave data analysis workflows. Detailed experimental results illustrate that RRA can dramatically reduce CPU and memory usage of verification processes.

Published in:

Advanced Information Networking and Applications - Workshops, 2008. AINAW 2008. 22nd International Conference on

Date of Conference:

25-28 March 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.