In this study, the relationship between FE characteristics and defects measured by RAMAN scattering in the MWNT cathodes treated by plasma and laser was investigated. The laser power used in RAMAN scattering was about 0.1 mW with a spot area of 8.8 mum2, corresponding to a power density of 1 kW/cm2, which did not induce any damage on the MWNT film. This result indicates that the defects such as dangling bonds in CNTs, acting as emission sites, play an important role on the emission characteristics by the surface treatment.
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Vacuum Nanoelectronics Conference, 2007. IVNC. IEEE 20th International
Date of Conference: 8-12 July 2007